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KES3250LSG
The KES3250LSG from Eaton Cutler-Hammer is an electronic trip unit designed for reliable circuit protection. It supports a rated current of 250 A and operates at a voltage of 600 VAC, providing essential performance in three-phase systems.
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Technical specifications for KES3250LSG
| Manufacturer | Eaton Cutler-Hammer |
|---|---|
| Product Type | Electronic Trip Unit |
| Product Line | Series C Circuit Breakers |
| Part Number | KES3250LSG |
| Weight | 1.00 lbs (0.45 kg) |
| UPC | 786679271117 |
| Rated Current | 250 A |
| Rated Voltage | 600 VAC |
| Number of Poles | 3 poles |
| Trip Functions | LSG (Long-Time, Short-Time, and Ground Fault Protection) |
| Protection Type | Solid-State Electronic |
| Compatible Frame Types | Series C - KD, DK, KDB, HKD, HKDB, KDC, CKD, CHKD, KW, HKW, KWC |
| Interrupting Rating | 65 KAIC |
| Mounting Type | Plug In Mount |
| Phase Type | 3 Phase |
The KES3250LSG part from Eaton Cutler-Hammer serves as an electronic trip unit integral to circuit breaker functionality. Operating at an industry-standard rated current of 250 A, this device efficiently handles voltages up to 600 VAC. Designed for a three-phase environment, it includes three poles, which accommodates diverse electrical systems.
One of the significant advantages of the KES3250LSG is the inclusion of comprehensive trip functions: long-time, short-time, and ground fault protection, collectively known as LSG. This ensures that the unit can respond appropriately to overcurrent conditions, enhancing operational safety. The protection mechanism relies on solid-state electronics, providing a robust solution to electric fault interruptions.
This trip unit weighs 3 lbs, making it a manageable component within larger setups. It is designed to be plugged directly into compatible frame types, such as the Series C models KD, DK, KDB, HKD, HKDB, KDC, CKD, CHKD, KW, HKW, and KWC, facilitating an efficient installation process. Additionally, it boasts a powerful interrupting rating of 65 KAIC, highlighting its capability to manage significant fault currents without compromising the integrity of the system.
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